This machine is the Full-Automatic LED Wafer Prober used for automatic measurement if electrical and optical characteristic including power and wave length of the LED wafer already cut and expanded on the tape.
Wafer are loaded, scanned , aligned , tested and unloaded automatically.
it is scannned by the vision system before its probing operation.
②Our original flexible probe head has a touch sensor.
With this advantage, stable probing with stable probe needle contact
onto the pad can be realized even if the wafer has warpage or various thickness.
③A CCD camera and monitor are used for needle position adjustment.
4 inch or less