Prober【WPFI3000】with Integrating Sphere
Full Auto LED Integrating Sphere Prober
LED wafer prober with integrating sphere measures electric and optical characteristics
of a LED wafer or LED chips on the tape reliably in high speed by the combination of our tester and integrating sphere.
①The total power of 145 degree range can be taken into the integrating sphere by minimizing the distance between a chip surface and the sphere window.

②Four channels operation is realized with our original high speed tester.

③A sigularized wafer can be tested after scanned by the vision system.