Prober【WPFR4000】for Flip Chip
Full Auto LED Flip Chip Prober
This machine measures a LED wafer in terms of electric and optical characteristics by our own tester.
It has an additional light detecting unit under the glass stage for backside light measurement for a flip type LED wafer.
①Probe pins, instead of a stage , move up and down to realize high speed operation and keep the distance between dice and a detecting unit constant.

②Multi channnel testing is possible to save operation time.

③Wafer alignment and probe pin adjustment can be easily executed while a wafer is motioned on the screen.

・Auto wafer alignment function
・Dice Position Memory function for cut and expand wafers
・NG DICE marking
・Wafer Changer