OPTO-SYSTEM CO., LTD.

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SEMICONJAPAN 2008

October 28, 2008

It exhibits to SEMICON JAPAN2008 held from December 3 to the 5th.

Devices exhibited this time are two models.
"LED Wafer Prober with Integrating Sphere"
"LD Life Test & Burn-In System"

LED wafer prober with integrating sphere measures electric and optical characteristics of a LED wafer or LED chips on the tape reliably in high speed by the combination of our new tester and an integrating sphere.

New LD life test & burn-in system made by Telops is also introduced.

The exhibition place becomes 11A-007 of 11 halls.
A lot of coming, and we will sincerely wait

This time,we release two products in response to customers' needs. Both of these products with Windows control system realizes "Easy-Operation"

	WDH1101 Automatic alignment for chips improves the tact-time of it.( Compared to our existing machines )
	WMSS2000 Our own machine mechanism improves the tact-time for measurement.( Compared to our existing machines )
We will put out the introduction page of our new products on a near day.